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Jean-François Pollet interview with Sean O’Kane ChipEstimate.TV at TSMC OIP ForumChipEstimate
Learn moreAutomated on-the-fly verification of designs using detector-based methodologyS4D – System, Software, SoC and Silicon Debug Conference, Munich, GermanyD.Dammers, W.Guo, F.Masson, L.M.Voßkämper
Learn moreChallenges of Monitoring High-voltage Battery Packs in Hybrid and Electric Vehicles W.Guo, C.DominguesJune 2011 GSA Forum
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